NJMET: New Jersey Micro Electronic Testing
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Digital Microcircuit Testing Capabilities


   Electronic Digital Testing

SSI/MSI/LSI/VLSI/VHLSI

DC/AC

SYMBOL

PARAMETERS

REMARKS

 
VOH
VOL
IIH
IIL
IOH
IOL
IOS
X
X
X
.
ICCL
ICCH
BV
.
IINH.

IINL


 
High level output voltage
Low level output voltage
High level input current
Low level input current
High level output current
Low level output current
Output short circuit current
Output leakage current
Noise margins
.
.
Low level supply current drain
High level supply current drain
Breakdown voltage
Where node terminals exist:
a. High level node current

b. Low level node current


 
.
.
.
.
Measure in conjunction with VOH
Measure in conjunction with VOL
.
.
Where noise margin is regarded as critical to the application
.
Where applicable
Where applicable
.
.
At specified VINH
At specific VINH


VIH
|VIL
VIK

Input voltage high
Input voltage low
Input voltage clamp

AC

--

Dynamic

Where applicable and/or when specifically requested and quoted accordingly

FUNCTIONAL OUTPUT EXERCISE PERFORMANCE

NOTE: MEMORY & LSI DEVICES – CONTACT NJMET ENGINEERING DEPARTMENT FOR TEST DETAILS

 

Very Large Scale Integrated Circuit Testing

Large Scale Intergrate Circuit Testing



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