Digital Microcircuit Testing Cap

METROPOLITAN LABORATORIES
London	Republic of China	Clifton, NJ	Los Angeles

Digital Microcircuit Testing Capabilities

Digital Testing

SSI/MSI/LSI/VLSI/VHLSI

DC/AC

SYMBOL

PARAMETERS

REMARKS

VOH

VOL

.IH

.IOH

.IIL

IOL

IOS

ICES.
.

ICCL

ICCH

IINH.

IINL

High level output voltage

Low level output voltage

High level input current

Low level input current

High level output current

Low level output current

Output short circuit current

Output leakage current

Noise margins
.

Low level supply current drain

High level supply current drain

Breakdown voltage

Where node terminals exist:

a. High level node current

b. Low level node current

.Measure in conjunction with VOH

.Measure in conjunction with VOL

Where noise margin is regarded as critical to the application

Where applicable

At specified VINH

At specific VINH

VIH
|VIL
VIK

Input voltage high
Input voltage low
Input voltage clamp

Dynamic

Where applicable and/or when specifically requested and quoted accordingly

FUNCTIONAL OUTPUT EXERCISE PERFORMANCE

NOTE: MEMORY & LSI DEVICES – CONTACT NJMET ENGINEERING DEPARTMENT FOR TEST DETAILS

Very Large Scale Integrated Circuit Testing

Large Scale Intergrate Circuit Testing