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On
June 16, 2010 Julia
Baaklini, a graduate of
DePaul
 Catholic
High School,
was presented with the
annual NJMET Scholarship
Award
NJMET
representative Nicole
Federico is pictured
presenting the award to
Ms. Baaklini alongside
Guidance Director John
Galka with the
commemorative citation
in conjunction with a
United States Savings
Bond for her outstanding
performance and positive
leadership.
The
award, in its tenth
year, developed by NJMET
Vice President, and Wayne resident,
Joseph Federico
recognizes students in
the metropolitan area
who excel in the fields
of Science and
Technology.
New Jersey
Micro Electronic
Testing, Inc. is
recognized worldwide as
the leader in state of
the art electronic
component testing
accommodating the
Commercial, Industrial,
Military, and Aerospace
fields.
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