Accelerated Life Tests Yield Failure Data Fast
Test & Measurement World, 5/1/2004
Joseph G. Federico, New Jersey Micro Electronic Testing Inc.

In May 2004, Rick Nelson – Editor in Chief of Test and Measurement magazine – published Joseph G. Federico’s article on Accelerated Life Testing. The article objective was to provide in depth information on environmental models and formulas that can assist quality and reliability engineers with important information on accelerated life testing of electronic components, it’s aging process and how to yield failure data fast.

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